• DocumentCode
    2555336
  • Title

    Electric field strengths created by electrosurgical units

  • Author

    Nelson, Robert ; Ji, Hualiang

  • Author_Institution
    Dept. of Electr. Eng., North Dakota State Univ., Fargo, ND, USA
  • fYear
    1994
  • fDate
    22-26 Aug 1994
  • Firstpage
    366
  • Lastpage
    370
  • Abstract
    The electromagnetic environment found in hospital operating rooms can be quite hostile to electronic medical devices. The electromagnetic fields existing in the operating rooms are created by both distant sources such as AM and FM broadcast towers as well as local sources such as electrosurgical units. In this paper, results are presented of electric field strengths created by a typical electrosurgical unit. The field strengths are given as a function of frequency. Electric fields as large as 44 V/m were measured 1 meter from the electrosurgical unit. Interference was observed on monitoring equipment in the operating room during operation of the electrosurgical unit. Measurement results can be used by both the manufacturers of medical equipment as well as appropriate standards organizations when evaluating how to minimize the severity of electromagnetic interference in operating rooms
  • Keywords
    biomedical engineering; biomedical equipment; electric field measurement; electromagnetic interference; interference suppression; surgery; AM broadcast towers; FM broadcast towers; electric field strength; electric fields; electromagnetic environment; electromagnetic interference; electronic medical devices; electrosurgical units; frequency; hospital operating room; interference suppression; measurement results; medical equipment; monitoring equipment; standards organizations; Biomedical monitoring; Broadcasting; Electric variables measurement; Electromagnetic devices; Electromagnetic fields; Electromagnetic measurements; Frequency; Hospitals; Interference; Poles and towers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1398-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1994.385616
  • Filename
    385616