• DocumentCode
    2555955
  • Title

    Distortion of radiation patterns for leakage power transmitted through attenuating cover panels and shielding gaskets-need for reverberation chamber measurement of total leakage power

  • Author

    Quine, J.P. ; Pesta, A.J. ; Streeter, J.P. ; Surowic, E.A.

  • Author_Institution
    Rome Lab., Griffiss AFB, NY, USA
  • fYear
    1994
  • fDate
    22-26 Aug 1994
  • Firstpage
    285
  • Lastpage
    290
  • Abstract
    Measurements are presented on the free-space radiation patterns from large apertures (>λ) covered with an attenuating plastic cover panel that employs fibers or metal mesh to produce absorption. It is shown that the patterns can be significantly and unpredictably distorted due to non-uniform transmission through the panel caused by variations in material composition throughout the volume of the panel. The results also show that leakage around the edges of the panel can have a significant effect. Due to the complexity and unpredictability of these patterns, it is concluded that the total leakage power cannot be measured readily in an anechoic chamber, but can be measured most readily if the panel radiates into a reverberation chamber
  • Keywords
    attenuation measurement; electromagnetic wave absorption; magnetic shielding; microwave measurement; power measurement; reverberation chambers; absorption; attenuating plastic cover panel; attenuation measurement; fibers; free-space radiation patterns; large apertures; leakage power transmission; material composition; metal mesh; microwave leakage power; non-uniform transmission; radiation patterns distortion; reverberation chamber measurement; shielding gaskets; total leakage power; Anechoic chambers; Apertures; Area measurement; Attenuation measurement; Distortion measurement; Gaskets; Power measurement; Probes; Reverberation chamber; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1994. Symposium Record. Compatibility in the Loop., IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    0-7803-1398-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1994.385645
  • Filename
    385645