• DocumentCode
    2556668
  • Title

    Feasible methods for the evaluation of the specific absorption rate and the temperature rise in the human eyes

  • Author

    Liu, Li ; Nikolova, Natalia K. ; Sangary, Nagula T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    1321
  • Lastpage
    1324
  • Abstract
    We propose two feasible methods for the evaluation of the maximum specific absorption rate (SAR) in the human eyes due to exposure to radio-frequency (RF) fields. The methods are applied to the case of near-field exposure to handheld devices; however, they are applicable to the case of far-field illumination as well. The first method is based on a semi-analytical model of the eye. As an input, it requires the measured or simulated open-space field of the device under test. As an output, depending on the mutual position and orientation of the eye and the device, it produces the maximum SAR value in the eye averaged over 1 and 10 grams of tissue. The second method is based on measurements. It requires the fabrication of a simple eye phantom and relies on a standard measurement with an SAR robot. The measurement method is complementary to the semi-analytical model and can be used to verify its output through one additional field measurement in open space. We also develop a detailed simulation eye model, which allows for the calculation of the temperature rise in the eyes for a given device under test. The proposed methods allow for the fast and reliable SAR evaluation of newly developed handheld devices in an industrial environment.
  • Keywords
    biological effects of fields; dosimetry; eye; mobile handsets; SAR robot; far-field illumination; handheld devices; human eyes; radiofrequency fields; specific absorption rate; temperature rise; Eyes; Fabrication; Handheld computers; Humans; Imaging phantoms; Lighting; Radio frequency; Specific absorption rate; Temperature; Testing; Specific absorption rate; near-field pattern; radiation hazard; thermal effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165948
  • Filename
    5165948