DocumentCode
2557786
Title
Impact of the semiconductor diode structure on the virtual local oscillator leakage of GaAs sub-harmonic mixers
Author
Gutta, Venkata ; Parker, Anthony E. ; Fattorini, Anthony
Author_Institution
Dept. of Phys. & Eng., Macquarie Univ., Sydney, NSW, Australia
fYear
2009
fDate
7-12 June 2009
Firstpage
1509
Lastpage
1512
Abstract
Diode mismatch in an anti-parallel diode mixer results in an unwanted virtual leakage at twice the local oscillator pumping frequency. Random variability in a fabrication process is one of the sources of diode mismatch. In some fabrication processes, a diode usually consists of a transistor with source and drain shorted together. The layout of this structure introduces a systematic source of diode mismatch. An informed selection of the fabrication process is crucial in minimizing the systematic source of diode mismatch and improving the virtual local oscillator leakage.
Keywords
III-V semiconductors; gallium arsenide; mixers (circuits); semiconductor diodes; GaAs; local oscillator pumping frequency; random variability fabrication process; semiconductor diode structure; subharmonic mixer; virtual local oscillator leakage; Circuits; Fabrication; Frequency; Gallium arsenide; HEMTs; Heterojunction bipolar transistors; Local oscillators; Mixers; Schottky diodes; Semiconductor diodes; Microwave Mixers; Millimeter wave mixers; Mixers;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
Conference_Location
Boston, MA
ISSN
0149-645X
Print_ISBN
978-1-4244-2803-8
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2009.5165995
Filename
5165995
Link To Document