• DocumentCode
    2557786
  • Title

    Impact of the semiconductor diode structure on the virtual local oscillator leakage of GaAs sub-harmonic mixers

  • Author

    Gutta, Venkata ; Parker, Anthony E. ; Fattorini, Anthony

  • Author_Institution
    Dept. of Phys. & Eng., Macquarie Univ., Sydney, NSW, Australia
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Firstpage
    1509
  • Lastpage
    1512
  • Abstract
    Diode mismatch in an anti-parallel diode mixer results in an unwanted virtual leakage at twice the local oscillator pumping frequency. Random variability in a fabrication process is one of the sources of diode mismatch. In some fabrication processes, a diode usually consists of a transistor with source and drain shorted together. The layout of this structure introduces a systematic source of diode mismatch. An informed selection of the fabrication process is crucial in minimizing the systematic source of diode mismatch and improving the virtual local oscillator leakage.
  • Keywords
    III-V semiconductors; gallium arsenide; mixers (circuits); semiconductor diodes; GaAs; local oscillator pumping frequency; random variability fabrication process; semiconductor diode structure; subharmonic mixer; virtual local oscillator leakage; Circuits; Fabrication; Frequency; Gallium arsenide; HEMTs; Heterojunction bipolar transistors; Local oscillators; Mixers; Schottky diodes; Semiconductor diodes; Microwave Mixers; Millimeter wave mixers; Mixers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International
  • Conference_Location
    Boston, MA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-2803-8
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2009.5165995
  • Filename
    5165995