• DocumentCode
    2558658
  • Title

    Characterization of polybenzimidazole (PBI) film at high temperatures

  • Author

    Hammoud, A.N. ; Suthar, J.L.

  • Author_Institution
    Sverdrup Technol. Inc., Cleveland, OH, USA
  • fYear
    1990
  • fDate
    3-6 Jun 1990
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    Polybenzimidazole, a linear thermoplastic polymer with excellent thermal stability and strength retention over a wide range of temperatures, was evaluated for its potential use as the main dielectric in high-temperature capacitors. The film was characterized in terms of its dielectric properties in a frequency range of 50 Hz to 100 kHz. These properties, which included the dielectric constant and dielectric loss, were also obtained in a temperature range from 20°C to 300°C with an electrical stress of 60 Hz, 50 V/mil. The AC and DC breakdown voltages of silicone oil-impregnated films as a function of temperature were also determined. The results obtained indicate that, while the film remained relatively stable up to 200°C, it exhibited an increase in its dielectric properties as the temperature was raised to 300°C. It was also found that conditioning of the film by heat treatment at 60°C for 6 h tends to improve its dielectric and breakdown properties
  • Keywords
    capacitors; dielectric loss measurement; electric breakdown of solids; permittivity measurement; polymer films; 20 to 300 degC; 50 Hz to 100 kHz; AC breakdown voltages; DC breakdown voltages; PBI film; dielectric constant; dielectric loss; dielectric properties; heat treatment; high-temperature capacitors; linear thermoplastic polymer; polybenzimidazole; silicone oil-impregnated films; strength retention; thermal stability; Capacitors; Dielectric constant; Dielectric losses; Frequency; Heat treatment; Polymers; Semiconductor films; Stress; Temperature distribution; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1990., Conference Record of the 1990 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1990.109793
  • Filename
    109793