Experimental verification of sensitivity improvement in near field probes using single negative metamaterials

Author

Boybay, Muhammed S. ; Ramahi, Omar M.

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada

fYear

2009

fDate

7-12 June 2009

Firstpage

1677

Lastpage

1680

Abstract

In this work, we present the first experimental verification of the sensitivity improvement of evanescent field probes using single negative (SNG) metamaterials. The response of an electrically small probe to an electrically small target is investigated. The deviation in the phase of reflection coefficient due to the target is measured. When an SNG layer is employed, phase shift due to presence of a target is improved 9 times compared to a classical probe.

Keywords

metamaterials; microwave materials; sensitivity analysis; SNG layer; electrically small probe; evanescent field probe; near field probe; reflection coefficient; sensitivity improvement; single-negative metamaterial; Composite materials; Magnetic field measurement; Magnetic materials; Metamaterials; Optical ring resonators; Probes; Reflection; Shape control; Slabs; Tellurium; Evanescent field amplification; Near field detection; Split ring resonators; subwavelength resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2009. MTT '09. IEEE MTT-S International

Conference_Location

Boston, MA

ISSN

0149-645X

Print_ISBN

978-1-4244-2803-8

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2009.5166037

Filename

5166037