DocumentCode
2558999
Title
Squeeze-film damping in solid-state accelerometers
Author
Starr, J.B.
Author_Institution
Honeywell Inc., Plymouth, MN, USA
fYear
1990
fDate
4-7 June 1990
Firstpage
44
Lastpage
47
Abstract
Criteria are set forth that are aimed at altering the designer to the onset of nonlinear and compressible effects in accelerometers. A finite-element technique is presented that essentially solves Reynold´s equation for small displacements and squeeze numbers by analogy with heat conduction in a solid with internal heat generation. Examples are presented that show film pressure profiles generated for complex geometries with nonuniform film thicknesses and squeeze velocities. A technique for mitigation of compressibility effects through film pressurization is suggested. Ideal damping results if both the squeeze number and the relative displacement are kept much less than 1.0. If these conditions are satisfied, one can then use finite-element techniques to estimate damping coefficients for other than simple geometries.<>
Keywords
accelerometers; finite element analysis; Reynold´s equation; complex geometries; compressible effects; damping; film pressure profiles; finite-element technique; nonlinear effects; solid-state accelerometers; squeeze numbers; Accelerometers; Damping; Finite element methods; Frequency; Geometry; Shock absorbers; Silicon; Solid state circuits; Temperature dependence; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE
Conference_Location
Hilton Head Island, SC, USA
Type
conf
DOI
10.1109/SOLSEN.1990.109817
Filename
109817
Link To Document