• DocumentCode
    2558999
  • Title

    Squeeze-film damping in solid-state accelerometers

  • Author

    Starr, J.B.

  • Author_Institution
    Honeywell Inc., Plymouth, MN, USA
  • fYear
    1990
  • fDate
    4-7 June 1990
  • Firstpage
    44
  • Lastpage
    47
  • Abstract
    Criteria are set forth that are aimed at altering the designer to the onset of nonlinear and compressible effects in accelerometers. A finite-element technique is presented that essentially solves Reynold´s equation for small displacements and squeeze numbers by analogy with heat conduction in a solid with internal heat generation. Examples are presented that show film pressure profiles generated for complex geometries with nonuniform film thicknesses and squeeze velocities. A technique for mitigation of compressibility effects through film pressurization is suggested. Ideal damping results if both the squeeze number and the relative displacement are kept much less than 1.0. If these conditions are satisfied, one can then use finite-element techniques to estimate damping coefficients for other than simple geometries.<>
  • Keywords
    accelerometers; finite element analysis; Reynold´s equation; complex geometries; compressible effects; damping; film pressure profiles; finite-element technique; nonlinear effects; solid-state accelerometers; squeeze numbers; Accelerometers; Damping; Finite element methods; Frequency; Geometry; Shock absorbers; Silicon; Solid state circuits; Temperature dependence; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensor and Actuator Workshop, 1990. 4th Technical Digest., IEEE
  • Conference_Location
    Hilton Head Island, SC, USA
  • Type

    conf

  • DOI
    10.1109/SOLSEN.1990.109817
  • Filename
    109817