• DocumentCode
    2559188
  • Title

    A 30Gb/s/link 2.2Tb/s/mm2 inductively-coupled injection-locking CDR

  • Author

    Take, Yasuhiro ; Miura, Noriyuki ; Kuroda, Tadahiro

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    2010
  • fDate
    8-10 Nov. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a 30 Gb/s/link 2.2 Tb/s/mm2 inductive-coupling link for a high-speed DRAM interface. The data rate per layout area is the highest among DRAM interfaces reported up to now. The proposed interface employs a high-speed injection-locking CDR technique that utilizes the derivative property of inductive coupling. Compared to conventional injection-locking CDR based on an XOR edge detector, our technique doubles the operation speed and increases the data rate to 30 Gb/s/link. As a result, the data rate per layout area is increased to 2.2 Tb/s/mm2, which is 2X that of the state-of-the-art inductive-coupling link, and 22X that of the state-of-the-art wired link.
  • Keywords
    DRAM chips; clock and data recovery circuits; XOR edge detector; clock; data recovery; high-speed DRAM interface; inductive-coupling link; inductively-coupled CDR; injection-locking CDR; Layout; Phase locked loops; Random access memory; Receivers; Synchronization; Transmitters; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2010 IEEE Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8300-6
  • Type

    conf

  • DOI
    10.1109/ASSCC.2010.5716562
  • Filename
    5716562