• DocumentCode
    2560039
  • Title

    Developing statistical models in an early warning system and its empirical study

  • Author

    Chen, Pei-Nong ; Chien, Chen-Fu ; Wang, Sheng-Jen ; Chen, Chien-Chung ; Luo, Haw-Jyue

  • Author_Institution
    Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2004
  • fDate
    9-10 Sept. 2004
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    When a new equipment or process is released, it is critical to ensure it behave as expected and stay in normal condition. The study proposes a research framework in which a statistical model is constructed for newly released equipment and process monitoring. An empirical study is conducted in a DRAM fabrication facility for validation. Based on the model, a best set of sample test items which discriminates the newly released equipment is selected and a group of normal equipments is obtained. Thus, the alarm signals can be triggered in an early warning system.
  • Keywords
    DRAM chips; alarm systems; integrated circuit manufacture; preventive maintenance; process monitoring; production equipment; statistical analysis; DRAM fabrication facility; developing statistical model; early warning system; process monitoring; semiconductor manufacturing; Alarm systems; Data engineering; Data mining; Fabrication; Manufacturing processes; Monitoring; Power system modeling; Random access memory; Signal processing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop Proceedings, 2004
  • Print_ISBN
    0-7803-8469-5
  • Type

    conf

  • DOI
    10.1109/SMTW.2004.1393758
  • Filename
    1393758