• DocumentCode
    2560662
  • Title

    Accuracy of linear attenuation coefficients measured with a photon counting CT system

  • Author

    Kobayashi, Takehiko ; Ogawa, Koichi ; Kaibuki, Futoshi ; Yamakawa, Takeshi ; Nagano, Takeshi ; Hashimoto, Dieter

  • Author_Institution
    Grad. Sch. of Eng., Hosei Univ., Tokyo, Japan
  • fYear
    2012
  • fDate
    Oct. 27 2012-Nov. 3 2012
  • Firstpage
    3596
  • Lastpage
    3599
  • Abstract
    The purpose of our research is to develop a photon counting CT system with a semiconductor detector. The photon counting CT system enables us to decompose materials, and this information is useful to diagnose diseases. We developed a new CdTe detector that was able to measure x-rays with the count rate of 107 counts/sec/mm2 with four energy windows. The size of a CdTe detector module was 8×8 mm2, and that of a pixel was 0.2 × 0.2 mm2. The thickness of the detector was 1 mm. The active area of our detector was 8 × 144 mm2. We evaluated the performance of the photon counting CT images in terms of the accuracy of reconstructed linear attenuation coefficients. In addition, we compared these reconstructed images with those acquired with the energy integration detector with the CdTe semiconductor detector. The results showed that our detector could reconstruct linear attenuation coefficients with the error ratio of less than 3 % compared with the theoretical value.
  • Keywords
    II-VI semiconductors; cadmium compounds; computerised tomography; photon counting; semiconductor counters; CdTe; CdTe detector; CdTe semiconductor detector; X-ray measurement; detector thickness; disease diagnosis; energy integration detector; linear attenuation coefficient accuracy; material decomposition; photon counting CT images; photon counting CT system; reconstructed linear attenuation coefficients;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-2028-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2012.6551825
  • Filename
    6551825