Measurements of optical frequency ratios using a compensated field sigmameter

Author

Bouchareine, P. ; Himbert, M. ; Hachour, A. ; Juncar, P. ; Millerioux, Y. ; Razet, A.

Author_Institution

Inst. Nat. de Metrol., CNAM, Paris, France

fYear

1990

fDate

11-14 June 1990

Firstpage

96

Lastpage

97

Abstract

Optical frequency ratios have been measured in the range from 576 to 633 nm at 10/sup -10/ relative accuracy level using a two-way-compensated field Michelson-type interferometer. The light sources consisted of He-Ne lasers and CW tunable dye lasers locked on the frequencies of hyperfine components of well-known molecular iodine lines. The instrumentation and measurement procedure are described. The accuracy of the measurements is shown to be approximately=8*10/sup -11/. Correction for a linear deviation from chromaticity is discussed.<>

Keywords

dye lasers; frequency measurement; gas lasers; helium; laser beam applications; light interferometers; measurement standards; neon; optical variables measurement; 576 to 633 nm; CW tunable dye lasers; He-Ne lasers; I/sub 2/; chromaticity; compensated field sigmameter; hyperfine components; light sources; linear deviation; molecular iodine lines; optical frequency ratios; two-way-compensated field Michelson-type interferometer; Amplitude modulation; Eyes; Fiber lasers; Frequency measurement; Laser beams; Laser stability; Mirrors; Optical interferometry; Phase modulation; Quantum cascade lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on

Conference_Location

Ottawa, Ontario, Canada

Type

conf

DOI

10.1109/CPEM.1990.109940

Filename

109940