• DocumentCode
    2561285
  • Title

    Intelligent image correlation using genetic algorithms for measuring surface deformations in the autonomous inspection of structures

  • Author

    Mahajan, Ajay ; Pilch, Alan ; Chu, Tsuchin

  • Author_Institution
    Dept. of Mech. Eng. & Energy Processes, Southern Illinois Univ., Carbondale, IL, USA
  • Volume
    1
  • Issue
    6
  • fYear
    2000
  • fDate
    36770
  • Firstpage
    460
  • Abstract
    Summary form only given. Presents an intelligent digital image correlation technique that uses genetic algorithms to estimate surface displacements and strains for autonomous inspection of structures. Speckle patterns are spray painted on the surface of interest and pictures taken before and during loading using off-the-shelf CCD quickcams. Subpixel accuracy, required for measuring displacements and strains accurately, is obtained by using interpolation methods. An innovative adaptive scheme is used to develop a cost surface which is used to match the before and after image subsets with the help of genetic algorithms to search for the optimal match. Some potential applications for this work are to extract real time information on surface displacements and strains on aircraft in flight, submarines under water and civil infrastructures such as bridges and buildings
  • Keywords
    CCD image sensors; artificial intelligence; automatic optical inspection; correlation methods; deformation; genetic algorithms; image processing; interpolation; structural engineering; CCD cameras; CCD quickcams; GA; aircraft; autonomous structure inspection; bridges; buildings; civil infrastructures; displacement measurement; genetic algorithms; intelligent digital image correlation technique; interpolation; real-time information extraction; speckle patterns; spray paint; strain estimation; strain measurement; submarines; subpixel accuracy; surface deformation measurement; surface displacement estimation; surface displacements; Capacitive sensors; Charge coupled devices; Digital images; Displacement measurement; Genetic algorithms; Inspection; Intelligent structures; Speckle; Spraying; Strain measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2000. Proceedings of the 2000
  • Conference_Location
    Chicago, IL
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-5519-9
  • Type

    conf

  • DOI
    10.1109/ACC.2000.878942
  • Filename
    878942