• DocumentCode
    2561367
  • Title

    Calculation of the Shapiro step amplitudes in two-dimensional Josephson tunnel junctions (voltage standard)

  • Author

    Klein, U. ; Schroder, S. ; Hinken, J.H.

  • Author_Institution
    Inst. of High-Frequency Eng., Tech. Univ. of Braunschweig, Germany
  • fYear
    1990
  • fDate
    11-14 June 1990
  • Firstpage
    112
  • Lastpage
    113
  • Abstract
    The amplitudes of RF-induced constant voltage steps in two-dimensional Josephson tunnel junctions is investigated theoretically using a first-order approximation of the current density distributions in the junction. A planar resonator model is used to analyze the electromagnetic field in the microwave-driven junction. It is found that the power dependence of the Shapiro step height in two-dimensional resonant junctions is different from that in one-dimensional junctions. The maximum amplitude is lower, and the microwave amplitude, which is needed to reach the maximum step height, is increased. The step amplitude oscillates with increasing power, but it does not reach zero. The smooth curve of the step amplitude near its maximum gives a wide microwave power region of sufficiently high step amplitudes in two-dimensional junctions.<>
  • Keywords
    Josephson effect; measurement standards; resonators; superconducting junction devices; voltage measurement; RF-induced constant voltage steps; Shapiro step amplitudes; current density distributions; electromagnetic field; first-order approximation; microwave amplitude; microwave-driven junction; planar resonator model; power dependence; resonant junctions; smooth curve; two-dimensional Josephson tunnel junctions; voltage standard; Current density; Electromagnetic fields; Josephson effect; Josephson junctions; Maxwell equations; Microwave antenna arrays; Partial differential equations; Resonance; Resonant frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 1990. CPEM '90 Digest., Conference on
  • Conference_Location
    Ottawa, Ontario, Canada
  • Type

    conf

  • DOI
    10.1109/CPEM.1990.109948
  • Filename
    109948