• DocumentCode
    2561535
  • Title

    Epoxy — Nano-carbon shielding coating for super-high-frequency range

  • Author

    Bellucci, S. ; Coderoni, L. ; Micciulla, F. ; Sacco, I. ; Rinaldi, G. ; Kuzhir, P. ; Paddubskaya, A. ; Shuba, M. ; Maksimenko, S. ; Macutkevic, J. ; Seliuta, D. ; Valusis, G. ; Adomavicius, R. ; Banys, J.

  • Author_Institution
    Frascati Nat. Lab., Nat. Inst. of Nucl. Phys., Frascati, Italy
  • Volume
    1
  • fYear
    2011
  • fDate
    17-19 Oct. 2011
  • Firstpage
    57
  • Lastpage
    60
  • Abstract
    Analysis on electromagnetic (EM) response properties of Modified Bisphenol A Epoxy Resin loaded with various types of commercial fillers, Multi-Wall CNTs (MWNTs), Single-Wall CNTs (SWNT), Carbon Black was made. The EM attenuation and reflection in Ka-band (26-37 GHz) provided by resin/SWCNT were measured as a function of the functional filler content (up to 1.5wt.%) and the EM coating thickness. A high THz attenuation ability is demonstrated in the range 0.2-3 THz by the CNT-based samples The transmission at 1 THz through the sample containing 0.5 wt.% of SWNT inclusions is 12 times less than through pure resin, and 3 times less in the case of MWNT incorporation. In the far-infrared frequency range (3-18 THz) a small reflection of the THz signal was observed (up to 5%) for all types of nanocarbon inclusions. The maximal reflection is demonstrated by the net epoxy resin, which denotes a strong screening effect of the given matrix. [1, 2].
  • Keywords
    carbon nanotubes; coatings; corrosion resistance; electromagnetic interference; filled polymers; high-frequency effects; infrared spectra; nanocomposites; nanofabrication; resins; terahertz waves; C; THz attenuation; bisphenol A epoxy resin; carbon black; electromagnetic coating; electromagnetic response; epoxy nanocarbon shielding coating; frequency 0.2 THz to 18 THz; infrared frequency; multiwalled carbon nanotubes; nanocarbon inclusions; singlewalled carbon nanotubes; Attenuation; Carbon; Coatings; Electromagnetics; Epoxy resins; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2011 International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-61284-173-1
  • Type

    conf

  • DOI
    10.1109/SMICND.2011.6095712
  • Filename
    6095712