• DocumentCode
    2562401
  • Title

    Performance degradation analysis using principal component method

  • Author

    Yang, Kai ; Yang, Guangbin

  • Author_Institution
    Dept. of Ind. & Manuf., Wayne State Univ., Detroit, MI, USA
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    136
  • Lastpage
    141
  • Abstract
    This paper describes a strategy of using the principal component method to analyze the performance characteristics of products. In particular, the authors relate performance characteristics to reliability and propose a relative reliability metric, which is useful in reliability screening. The importance of individual performance characteristics to reliability is evaluated. The importance indicates the critical characteristic and the direction in which efforts should be made to improve the reliability of a product. They use score plots to identify degradation modes and determine dominant degradation mechanisms. The principal component method is applied to analyze the degradation data of infrared light emitting diodes
  • Keywords
    failure analysis; light emitting diodes; reliability theory; semiconductor device reliability; degradation modes; dominant degradation mechanisms; infrared light emitting diodes; performance degradation analysis; performance reliability characteristics; principal component method; relative reliability metric; reliability screening; score plots; Covariance matrix; Data analysis; Degradation; Eigenvalues and eigenfunctions; Light emitting diodes; Measurement; Performance analysis; Performance loss; Principal component analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571684
  • Filename
    571684