DocumentCode
2562401
Title
Performance degradation analysis using principal component method
Author
Yang, Kai ; Yang, Guangbin
Author_Institution
Dept. of Ind. & Manuf., Wayne State Univ., Detroit, MI, USA
fYear
1997
fDate
13-16 Jan 1997
Firstpage
136
Lastpage
141
Abstract
This paper describes a strategy of using the principal component method to analyze the performance characteristics of products. In particular, the authors relate performance characteristics to reliability and propose a relative reliability metric, which is useful in reliability screening. The importance of individual performance characteristics to reliability is evaluated. The importance indicates the critical characteristic and the direction in which efforts should be made to improve the reliability of a product. They use score plots to identify degradation modes and determine dominant degradation mechanisms. The principal component method is applied to analyze the degradation data of infrared light emitting diodes
Keywords
failure analysis; light emitting diodes; reliability theory; semiconductor device reliability; degradation modes; dominant degradation mechanisms; infrared light emitting diodes; performance degradation analysis; performance reliability characteristics; principal component method; relative reliability metric; reliability screening; score plots; Covariance matrix; Data analysis; Degradation; Eigenvalues and eigenfunctions; Light emitting diodes; Measurement; Performance analysis; Performance loss; Principal component analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location
Philadelphia, PA
ISSN
0149-144X
Print_ISBN
0-7803-3783-2
Type
conf
DOI
10.1109/RAMS.1997.571684
Filename
571684
Link To Document