• DocumentCode
    2563866
  • Title

    Charging and discharging phenomena in simulated space environment

  • Author

    Hikita, Masayuki ; Cho, Mengu

  • Author_Institution
    Kyushu Inst. of Technol., Kitakyushu, Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    693
  • Abstract
    Large space platform needs to be operated at high voltage. When a solar array has a negative voltage more than 200 V with respect to the plasma, arcing occurs. Experiments are carried out in order to elucidate charging and discharging phenomena on a solar array in simulated space environment and find mitigation techniques against arcing. Arcing occurs at the triple junction, where solar cell coverglass, insulator, interconnector and conductor meet, because of the field enhancement. Once an arc occurs, the current is supplied through the plasma by the charge stored on the insulator surface nearby. It is found that transparent film placed in front of the solar array is effective to suppress the arcing onset and the arc current, because the film acts as the shield to prevent ions from charging the coverglass and the arc currents from flowing through the plasma
  • Keywords
    arcs (electric); solar cell arrays; space vehicle power plants; surface charging; vacuum arcs; arc current suppression; arcing mitigation; arcing onset suppression; charging phenomena; conductor; discharging phenomena; field enhancement; high voltage operation; insulator; insulator surface charge; interconnector,; large space platform; plasma; simulated space environment; solar array; solar cell coverglass; transparent film; triple junction; Conductors; Extraterrestrial phenomena; Fault location; Insulation; Photovoltaic cells; Plasma density; Plasma simulation; Space charge; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2000. Proceedings. ISDEIV. XIXth International Symposium on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5791-4
  • Type

    conf

  • DOI
    10.1109/DEIV.2000.879084
  • Filename
    879084