DocumentCode
2564103
Title
WIP evolution of a semiconductor factory after a bottleneck workcenter breakdown
Author
Rose, Oliver
Author_Institution
Inst. of Comput. Sci., Wurzburg Univ., Germany
Volume
2
fYear
1998
fDate
13-16 Dec 1998
Firstpage
997
Abstract
In semiconductor fabrication facilities, an increase in work in progress (WIP) can be observed even weeks after the failure of the bottleneck workcenter. We develop a simple fab model that facilitates the study of this phenomenon. The simplified factory consists of a detailed model of the bottleneck workcenter and a delay unit that represents the rest of the factory. After passing the delay unit, the lots are fed back to the bottleneck to model the cyclic flow of lots of real wafer fabs. We study the behavior of this model for numerous scenarios, and it turns out that by means of the model, the WIP increase phenomenon can successfully be reproduced. In addition, we provide first results on how to avoid the unwanted increase in inventory
Keywords
digital simulation; semiconductor device manufacture; stock control; WIP evolution; WIP increase phenomenon; bottleneck workcenter; bottleneck workcenter breakdown; cyclic flow; delay unit; inventory control; real wafer fabs; semiconductor fabrication facilities; semiconductor factory; simple fab model; simplified factory; work in progress; Computer science; Delay effects; Dispatching; Electric breakdown; Fabrication; Memory management; Production facilities; Semiconductor device breakdown; Semiconductor device modeling; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference Proceedings, 1998. Winter
Conference_Location
Washington, DC
Print_ISBN
0-7803-5133-9
Type
conf
DOI
10.1109/WSC.1998.745805
Filename
745805
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