• DocumentCode
    2565374
  • Title

    Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs

  • Author

    Yanagida, Nobuhiro ; Takahashi, Hiroshi ; Takamatsu, Yuzo

  • Author_Institution
    Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
  • fYear
    1996
  • fDate
    25-27 Jun 1996
  • Firstpage
    86
  • Lastpage
    95
  • Abstract
    The paper presents an approach to multiple fault diagnosis in sequential circuits by using input sequence pairs having sensitizing input pairs. This represents an extension of our previous work dealing with combinational circuits (N. Yanagida et al., 1995). After reviewing our previous method, we introduce an input sequence pair having sensitizing input pairs to diagnose multiple faults in a sequential circuit partitioned into subcircuits. We call such an input sequence pair, the sensitizing sequence pair. Next, we extend the use of the previous method for combinational circuits to sequential circuits. From a relation between a sensitizing path generated by a sensitizing sequence pair and a subcircuit, the proposed method deduces the suspected faults for the subcircuits, one by one, based on the responses observed at primary outputs without probing any internal line. The paper provides the first experimental reports on diagnostic results of the ISCAS circuits by using our diagnostic method for sequential circuits, without probing any internal line, any fault simulation, or fault enumeration
  • Keywords
    combinational circuits; fault diagnosis; logic testing; sequential circuits; ISCAS circuits; combinational circuits; diagnostic method; diagnostic results; input sequence pair; input sequence pairs; multiple fault diagnosis; primary outputs; sensitizing input pairs; sensitizing sequence pairs; sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computer science; Fault diagnosis; Fault location; Large scale integration; Logic testing; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault Tolerant Computing, 1996., Proceedings of Annual Symposium on
  • Conference_Location
    Sendai
  • ISSN
    0731-3071
  • Print_ISBN
    0-8186-7262-5
  • Type

    conf

  • DOI
    10.1109/FTCS.1996.534597
  • Filename
    534597