DocumentCode
2566654
Title
2007 7th International Conference on ASIC
fYear
2007
fDate
22-25 Oct. 2007
Abstract
The following topics are dealt with: VLSI systems and circuits; analog, mixed signal and RF circuits; application-specific SoCs; testing technology and design for testability; advanced memory, MEMS and NEMS techniques; CAD techniques; and VLSI design.
Keywords
CAD; VLSI; analogue circuits; design for testability; micromechanical devices; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; system-on-chip; CAD techniques; MEMS techniques; NEMS techniques; RF circuits; VLSI circuits; VLSI design; VLSI systems; analog circuits; application-specific SoC; design for testability; mixed signal circuits; testing technology;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2007. ASICON '07. 7th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4244-1131-3
Type
conf
DOI
10.1109/ICASIC.2007.4415538
Filename
4415538
Link To Document