DocumentCode
2566762
Title
The RASSP integrated systems tool set provides a concurrent engineering environment for design trade-offs
Author
Barnett, Gregory ; Fry, Charles
Author_Institution
Advanced Technol. Labs., Lockheed Martin, Camden, NJ, USA
fYear
1997
fDate
13-16 Jan 1997
Firstpage
220
Lastpage
225
Abstract
The goal of the DARPA/Tri-Service-sponsored Rapid Prototyping of Application Specific Signal Processors (RASSP) program is to reduce development and manufacturing time and cost of signal processors by a factor of four. Lockheed Martin´s Advanced Technology Laboratories (ATL) RASSP team has developed an integrated systems engineering tool set which forms the basis for a concurrent engineering design environment. This design environment, which consists of Ascent Logic´s RDD-100, PRICE Systems parametric cost estimation models, and Management Sciences RAM-ILS tools, provides the integrated product development team with cost and reliability estimation data within a systems engineering tool. The concurrent engineering design environment is described and an example is provided which demonstrates the value of the tool integration within the design environment. This design environment enables the integrated product development team to estimate the life-cycle costs and reliability early in the design process
Keywords
application specific integrated circuits; concurrent engineering; digital signal processing chips; failure analysis; product development; reliability theory; software prototyping; software tools; RAM-ILS tools; RASSP integrated systems tool; application specific signal processors; concurrent engineering design environment; concurrent engineering environment; design trade-offs; integrated product development; life-cycle costs; parametric cost estimation models; rapid prototyping; reliability estimation data; Concurrent engineering; Costs; Design engineering; Logic design; Manufacturing processes; Product development; Prototypes; Reliability engineering; Signal processing; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium. 1997 Proceedings, Annual
Conference_Location
Philadelphia, PA
ISSN
0149-144X
Print_ISBN
0-7803-3783-2
Type
conf
DOI
10.1109/RAMS.1997.571711
Filename
571711
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