DocumentCode
2568108
Title
SWITTEST: Automatic Switch-level Fault Simulation And Test Evaluation Of Switched-capacitor Systems
Author
Mir, S. ; Rueda, Andrea ; Olbrich, T. ; Peralías, E. ; Huertas, J.L.
Author_Institution
Instituto de Microelectronica de Sevilla
fYear
1997
fDate
9-13 June 1997
Firstpage
281
Lastpage
286
Keywords
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Integrated circuit testing; Permission; Switching circuits; System testing; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1997. Proceedings of the 34th
Conference_Location
Anaheim, CA, USA
ISSN
0738-100X
Print_ISBN
0-7803-4093-0
Type
conf
DOI
10.1109/DAC.1997.597158
Filename
597158
Link To Document