• DocumentCode
    2568230
  • Title

    Characterization of RF-Driven Slot Microplasmas using Optical Emission Spectroscopy

  • Author

    Rahman, A. ; Moore, C.A. ; Stan, U. ; Collins, G.J. ; Yalin, A.P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    157
  • Lastpage
    157
  • Abstract
    Summary form only given. We present measurements of optical emission spectra in the UV/VUV and visible regions from hollow-slot microplasmas operating at 13.56 and 60 MHz at atmospheric pressure. Spectra are presented for discharges that use helium gas flowing between the electrodes into open air, as well as helium with small admixtures of impurities (nitrogen and hydrogen). We observe that the microplasmas sustained at the higher frequency of 60 MHz operate with greater stability and can be sustained at relatively lower power as compared to the lower 13.56 MHz plasmas. Optical emission spectra from both atomic and molecular species are used to characterize various plasma properties including gas temperature, vibrational temperature, and relative rates of slow electron-metastable interactions. Optical emission spectra in the UV/VUV region indicate the role of secondary electrons emitted from electrode surfaces are markedly different for the two different excitation frequencies
  • Keywords
    helium; high-frequency discharges; plasma collision processes; plasma diagnostics; plasma impurities; plasma instability; plasma sources; plasma temperature; 13.56 MHz; 60 MHz; He; RF-driven slot microplasmas; atmospheric pressure; electron-metastable interactions; gas temperature; impurities; optical emission spectroscopy; secondary electrons; vibrational temperature; Atom optics; Electrodes; Electron optics; Frequency; Helium; Plasma properties; Plasma stability; Plasma temperature; Spectroscopy; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359155
  • Filename
    4198414