• DocumentCode
    2568500
  • Title

    20 TORR Gas Cell Focussing in the Paraxial Diode.

  • Author

    Cooper, G.M. ; McLean, James ; Short, D.J. ; Oliver, Bryan V.

  • Author_Institution
    Atomic Weapons Establ., Reading
  • fYear
    2005
  • fDate
    20-23 June 2005
  • Firstpage
    167
  • Lastpage
    167
  • Abstract
    Summary form only given. The paraxial diode is routinely used to convert high intensity electron beams to bremsstrahlung X-radiation for use in experiments requiring flash radiography at AWE (Aldermaston). The paraxial diode is one of the diodes being considered for use on an inductive voltage adder (IVA) driver in the proposed core punch facility (CPF). The operation of the diode using a 20 torr air-fill in the gas cell as opposed to the traditionally used value of around 1 torr air will be presented. At present the performance of the diode is believed to be limited by significant focal sweeping which causes the radiographic spot to increase with time. It is anticipated that at the higher air pressures the magnetic diffusion timescale in the gas cell will be lower than the pulse length of the beam. Under these conditions the plasma return current will quickly diffuse away because of the high plasma resistivity. This causes the net current in the gas to quickly become equal to the beam current. It will be shown using particle in cell (PIC) modeling that under these conditions focal sweeping can be reduced which in turn results in smaller radiographic spot sizes. A comparison between the experiments carried out on Mogul D and the PIC models will be presented and the differences highlighted
  • Keywords
    bremsstrahlung; electron beams; plasma X-ray sources; plasma diodes; plasma simulation; plasma transport processes; plasma-beam interactions; 20 torr; Mogul D; bremsstrahlung X-radiation; core punch facility; electron beams; flash radiography; focal sweeping; gas cell focussing; inductive voltage adder; magnetic diffusion timescale; paraxial diode; particle in cell modeling; plasma resistivity; plasma return current; Atomic beams; Atomic measurements; Diodes; Electron beams; Plasma sources; Plasma x-ray sources; Radiography; USA Councils; Voltage; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2005. ICOPS '05. IEEE Conference Record - Abstracts. IEEE International Conference on
  • Conference_Location
    Monterey, CA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-9300-7
  • Type

    conf

  • DOI
    10.1109/PLASMA.2005.359173
  • Filename
    4198432