• DocumentCode
    2569649
  • Title

    Generalization of Shewhart X¯-chart

  • Author

    Houshmand, Ali A. ; Golnabi, Saeed ; Frosh, Mufaddal

  • Author_Institution
    Industrial Eng. Prog., Cincinnati Univ., OH, USA
  • fYear
    1997
  • fDate
    13-16 Jan 1997
  • Firstpage
    314
  • Lastpage
    319
  • Abstract
    In univariate quality control, the X¯-Charts have been useful in determining whether the process mean is in control or not. It would be very useful to have a similar chart applied to the multivariate case. The existing methods do not provide all the information that a quality control practitioner would like to possess such as the indication of which variables are causing the process to be out of control. In this paper we propose a method which allows us to simultaneously control the overall process quality characteristics and to identify the responsible variables leading to an out of control condition. This method is based on the adequate selection of the symmetric square root of the correlation matrix. The associated critical region is also discussed. The process considered is assumed to be multivariate normal with parameters known from historical data or estimated from a large sample. We call this method, “The Generalized Shewhart Chart (GS Chart)”, because it reduces to the Shewhart Chart when the process involves only one variable. The procedure has been illustrated with the help of two examples. The effectiveness of this method is compared with existing methods in this paper
  • Keywords
    matrix algebra; multivariable control systems; quality control; statistical process control; Generalized Shewhart Chart; Shewhart X¯-chart; correlation matrix; multivariate quality control; out of control condition; process mean; symmetric square root; univariate quality control; Character recognition; Control charts; Covariance matrix; Error analysis; Error correction; Industrial control; Monitoring; Process control; Quality control; Symmetric matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium. 1997 Proceedings, Annual
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3783-2
  • Type

    conf

  • DOI
    10.1109/RAMS.1997.571726
  • Filename
    571726