• DocumentCode
    2570806
  • Title

    A Test Synthesis Approach To Reducing Ballast Dft Overhead

  • Author

    Chang, Douglas ; Lee, Mike Tien-Chien ; Marek-Sadowska, Malgorzata ; Aikyo, Takashi ; Cheng, Kwang-Ting

  • Author_Institution
    Univ. of CaIifornia
  • fYear
    1997
  • fDate
    9-13 June 1997
  • Firstpage
    466
  • Lastpage
    471
  • Keywords
    Automatic test pattern generation; Automatic testing; Circuit synthesis; Circuit testing; Electronic ballasts; Flip-flops; Hardware; Permission; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1997. Proceedings of the 34th
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    0-7803-4093-0
  • Type

    conf

  • DOI
    10.1109/DAC.1997.597193
  • Filename
    597193
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2570806