• DocumentCode
    2571846
  • Title

    VLSI power wiring noise analysis using MOR method

  • Author

    Saeki, Kosuke ; Miwa, Hitoshi ; Suzuki, Goro

  • Author_Institution
    Univ. of Kitakyushu, Kitakyushu
  • fYear
    2007
  • fDate
    22-25 Oct. 2007
  • Firstpage
    1186
  • Lastpage
    1189
  • Abstract
    Demand for techniques to reduce verification time has been increasing in recent VLSI designs using sub-micron processes. The model order reduction (MOR) method by M.Celik et al. (2002) shortens verification time by reducing transfer functions order of the circuits. Employing the MOR method, we have developed a technique to analyze large scale power supply wirings of a whole DSP LSI chip. We have confirmed that our technique greatly improves circuit analysis capability maintaining sufficient accuracy.
  • Keywords
    VLSI; integrated circuit modelling; integrated circuit noise; power supply circuits; reduced order systems; wiring; DSP LSI chip; VLSI power wiring noise analysis; large scale power supply wiring; model order reduction method; Circuit analysis; Circuit noise; Digital signal processing chips; Large scale integration; Large-scale systems; Power supplies; Process design; Transfer functions; Very large scale integration; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2007. ASICON '07. 7th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-1132-0
  • Electronic_ISBN
    978-1-4244-1132-0
  • Type

    conf

  • DOI
    10.1109/ICASIC.2007.4415846
  • Filename
    4415846