Evaluation of semiconductor devices aging from in core flux detector amplifier used in nuclear power plants equipment

Author

Ilian, Virgil E. ; Dragan, Maria ; Bazu, Marius ; Oprea, Marcel ; Oprea, Irina ; Stoica, Maria ; Parvu, Ion

Author_Institution

Nat. Inst. for Res. & Dev. in Microtechnologies, Bucharest, Romania

Volume

2

fYear

2002

fDate

2002

Firstpage

355

Abstract

The paper describes the evaluation of semiconductor devices used in an in-core flux detector amplifier designed for nuclear power plant equipment. The semiconductor device aging was modeled using the Arrhenius equation under specified bias and signal conditions, temperature and activation energy, at module and component level.

Keywords

SPICE; ageing; environmental degradation; environmental testing; instrumentation amplifiers; modules; nuclear power stations; nuclear reactor instrumentation; radiation detection; semiconductor device measurement; semiconductor device models; semiconductor device reliability; Arrhenius equation modeling; Spice; component level model; device bias/signal conditions; device temperature/activation energy; module level model; modules; nuclear power plant core flux detector amplifiers; nuclear power plant equipment; nuclear power plant measuring/control instrumentation; semiconductor device aging evaluation; Acceleration; Aging; Detectors; Equations; Power amplifiers; Power generation; Semiconductor devices; Semiconductor optical amplifiers; Stress; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Conference, 2002. CAS 2002 Proceedings. International

Print_ISBN

0-7803-7440-1

Type

conf

DOI

10.1109/SMICND.2002.1105867

Filename

1105867