• DocumentCode
    2572865
  • Title

    Application-oriented robustness optimization based on metamodels

  • Author

    Oros, Anamaria ; Topa, Marina ; Neag, Marius ; Rafaila, Monica ; Pelz, Georg

  • Author_Institution
    Basis of Electron. Dept., Tech. Univ. of Cluj-Napoca, Cluj-Napoca, Romania
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    37
  • Lastpage
    41
  • Abstract
    Real-life systems should perform within tight limits even when affected by uncontrollable factors such as temperature and power supply variations. This paper outlines a methodology for robustness optimization based on the Design of Experiments and metamodelling concepts. The main idea is to derive metamodels of the mean response and its dispersion depending only on control factors; thus, the optimization can tackle more effectively the tasks of bringing the mean response to within a set range and minimize the response statistical dispersion. The proposed method was used to optimize the sizing of the external circuitry of a low dropout voltage regulator used in automotive applications; several parameters were improved, especially w.r.t. reducing their dispersion with temperature by up to 28.5%. The method makes no assumptions on the uncontrollable factors and can work with a large variety of metamodels employed; also, it can be easily extended to multiple-response optimization.
  • Keywords
    circuit optimisation; design of experiments; voltage regulators; application-oriented robustness optimization; automotive applications; control factors; design of experiments; external circuitry sizing; low dropout voltage regulator; metamodelling concepts; multiple-response optimization; power supply variations; response statistical dispersion; Delay; Dispersion; Noise; Optimization; Robustness; Temperature; Voltage control; Design of Experiments; Low-Dropout Voltage Regulator; Metamodelling; Robustness Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Technology in Electronic Packaging (SIITME), 2012 IEEE 18th International Symposium for
  • Conference_Location
    Alba Iulia
  • Print_ISBN
    978-1-4673-4760-0
  • Electronic_ISBN
    INAVLID ISBN
  • Type

    conf

  • DOI
    10.1109/SIITME.2012.6384342
  • Filename
    6384342