• DocumentCode
    2573105
  • Title

    Equipotential shells for efficient partial inductance extraction

  • Author

    Beattie, M. ; Alatan, L. ; Pileggi, L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1998
  • fDate
    6-9 Dec. 1998
  • Firstpage
    303
  • Lastpage
    306
  • Abstract
    The shift-truncate potential method was introduced as an approach to sparsify the partial inductance matrix while maintaining the stability and symmetry. This was accomplished with the use of spherical return shells around point-like current segments. In this paper we propose the use of filament current distributions for the same purpose. Ellipsoidal shells are introduced to model the equipotential surfaces for filament currents. Importantly, we prove that the positive definiteness of the resulting sparse partial inductance matrix is preserved for this and all other potential-shell models when the compensating currents are placed on equipotential surfaces of the original current distribution. The utility and efficiency of this ellipsoidal shell partial inductance approximation are demonstrated for both on-chip and system-level extraction examples.
  • Keywords
    current distribution; inductance; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; sparse matrices; IC interconnections; compensating currents; ellipsoidal shells; equipotential shells; filament current distributions; on-chip extraction; partial inductance extraction; point-like current segments; positive definiteness; shift-truncate potential method; sparse partial inductance matrix; spherical return shells; system-level extraction; Contracts; Current distribution; Ellipsoids; Equations; Inductance; Robustness; Roundoff errors; Sparse matrices; Stability; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-4774-9
  • Type

    conf

  • DOI
    10.1109/IEDM.1998.746360
  • Filename
    746360