• DocumentCode
    2574676
  • Title

    Equivalent circuits of microstrip discontinuities including radiation effects

  • Author

    Skrivervik, A. ; Mosig, J.R.

  • Author_Institution
    Ecole Polytech. Federale, Lausanne, Switzerland
  • fYear
    1989
  • fDate
    13-15 June 1989
  • Firstpage
    1147
  • Abstract
    An efficient theoretical method for the full-wave analysis of microstrip circuit elements has been developed, taking into account effects such as dispersion, coupling between elements, surface waves, ohmic and dielectric losses, and radiation. A de-embedding process allows the derivation of equivalent circuits independently of the feed model used. Results for bends and slots are in good agreement with measurements and reduce to quasistatic predictions in the low-frequency range. The method was first tested by analyzing a segment of a uniform microstrip line, and then it was applied to several two-port discontinuities (bends, slots, etc.). As shown in the theory, the method is easily extendable to any N-port structure. Discontinuities on other related substrate configurations (stripline, suspended, and multilayered microstrip) could be easily analyzed with this technique by using the pertinent Green´s functions.<>
  • Keywords
    equivalent circuits; losses; microwave circuits; strip line components; strip lines; waveguide theory; Green´s functions; MIC; bends; coupling; de-embedding process; dielectric losses; dispersion; equivalent circuits; full-wave analysis; low-frequency range; microstrip circuit elements; microstrip discontinuities; microwave circuits; multilayered microstrip; ohmic losses; quasistatic predictions; radiation effects; slots; stripline; surface waves; suspended substrate; two-port discontinuities; Circuit analysis; Circuit testing; Coupling circuits; Dielectric losses; Dielectric measurements; Dispersion; Equivalent circuits; Feeds; Microstrip; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1989., IEEE MTT-S International
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1989.38926
  • Filename
    38926