• DocumentCode
    2574947
  • Title

    Physical examination of high capacity nickel-hydrogen battery cells

  • Author

    Cruz, E.E. ; Lenhart, S.J. ; Yang, T.M.

  • Author_Institution
    Ford Aerosp., Palo Alto, CA, USA
  • fYear
    1989
  • fDate
    6-11 Aug 1989
  • Firstpage
    1371
  • Abstract
    In order to assess cell cycle performance and possible failure modes, some randomly selected nickel-hydrogen (Ni/H2) battery cells of 83 Ah capacity were put through a rapid cycle test at 80% depth of discharge (DOD) using simulated low-earth-orbit conditions. A destructive physical analysis (DPA) was performed on several cells following the cycle tests. After nearly 1000 charge/discharge cycles, the cells from one manufacturer exhibited significant voltage performance degradation and internal stack damage. The cells from another manufacturer exhibited little voltage degradation and no significant internal damage. The authors summarize the important results of the cell DPAs. In particular, polarization test results show that active material extrusion from the pores of the positive plates can cause cell voltage performance degradation. Also, electrolyte (KOH) concentration gradients within a stack can be caused by a cell dome-to-dome temperature gradients, and nonuniform stack wearout can result
  • Keywords
    hydrogen; nickel; secondary cells; testing; DOD; DPA; Ni-H2 secondary cells; cell cycle performance; cell dome-to-dome temperature gradients; charge/discharge cycles; depth of discharge; destructive physical analysis; internal stack damage; rapid cycle test; voltage performance degradation; Batteries; Degradation; Low earth orbit satellites; Manufacturing; Performance analysis; Performance evaluation; Polarization; Testing; US Department of Defense; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference, 1989. IECEC-89., Proceedings of the 24th Intersociety
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IECEC.1989.74647
  • Filename
    74647