• DocumentCode
    2575548
  • Title

    Effect of Ramp Rate on Microstructure and Properties of Thermomechanically-Fatigued Sn-3.5Ag Based Composite Solder Joints

  • Author

    Liu, Peng ; Gao, Yuan ; Cao, Qian ; Xia, Zhidong ; Lei, Yongping ; Guo, Fu

  • Author_Institution
    Beijing Univ. of Technol.
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Solder joints experience repeated reverse thermal stress in service, caused by the mismatch in the coefficient of thermal expansion (CTE) between solder and Cu substrate. Lead-free composite solder was fabricated by mechanically mixing Sn-3.5Ag solder paste with Cu reinforcement particles to improve service capability of the base solder alloy. Thermomechanical fatigue (TMF) tests were carried out in environmental chambers. Two temperature profiles, with the same extreme temperature of -40 degC to 125 degC and a 10-minute dwell time at temperature extremes, were applied in the tests. One was a 5-minute ramp time and another was a 20-minute ramp time. Microstructural characteristics and residual mechanical strengths of the solder joints were investigated after 0, 100, 250 and 500 TMF cycles. Composite solder joints showed better TMF performance than the Sn-3.5Ag eutectic solder joints. The results proved that ramp rate was one of the key issues for the damages in solder joints
  • Keywords
    composite materials; copper; silver alloys; solders; thermal expansion; thermal stresses; tin alloys; -40 to 125 C; 10 min; 20 min; 5 min; Cu-SnAg; coefficient of thermal expansion; composite solder joints; copper substrate; eutectic solder joints; lead-free composite solder; microstructure; ramp rate; solder alloy; solder paste; thermal stress; thermomechanical fatigue tests; Copper alloys; Environmentally friendly manufacturing techniques; Lead; Microstructure; Soldering; Temperature; Testing; Thermal expansion; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359742
  • Filename
    4198863