• DocumentCode
    2576446
  • Title

    Characterisation of 980nm Pump Laser Solder Joint Integrity Using Heat Pump Tests

  • Author

    Takyi, G. ; Beesley, C. ; Kendal, A. ; Baettig, R.

  • Author_Institution
    Dept. of Mech. Eng., Kwame Nkrumah Univ. of Sci. & Technol., Kumasi
  • fYear
    2007
  • fDate
    3-5 Oct. 2007
  • Firstpage
    238
  • Lastpage
    242
  • Abstract
    We describe a means of assessing the quality of the solder joints of chip-on-carrier (CoC), housing and heat pump assembly of 980 nm pump laser modules. Organic and oxide contamination on piece parts will lead to poor solder flow which may impact the thermal performance of the heat pump (or thermal electric cooler). In this paper, heat pump tests have been conducted for the evaluation of solder joint integrity using fluxless vacuum soldering. Structured experimental design was used to determine the critical vacuum soldering parameters .The results indicate that the condition of the Sn/Pb solder perform is the most critical parameter followed by the peak reflow temperature in terms of the heat pump performance. A technique was also developed for quantifying the visual observation criteria. The results show the peak reflow temperature as the most critical parameter that impacts the flow of solder.
  • Keywords
    cooling; heat pumps; semiconductor lasers; soldering; thermal management (packaging); chip-on-carrier; fluxless vacuum soldering; heat pump assembly; heat pump test; pump laser solder joint integrity; size 980 nm; solder flow; thermal electric cooler; thermal performance; Assembly; Contamination; Heat pumps; Laser excitation; Lead compounds; Pump lasers; Resistance heating; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 2007. IEMT '07. 32nd IEEE/CPMT International
  • Conference_Location
    San Jose, CA
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-1335-5
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2007.4417070
  • Filename
    4417070