DocumentCode
2577108
Title
Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints
Author
Che, F.X. ; Pang, H.L.J. ; Zhu, W.H. ; Sun, Wei ; Sun, Anthony Y S
Author_Institution
Packaging Anal. & Design Center, United Test & Assembly Center Ltd., Singapore
fYear
2006
fDate
26-29 Aug. 2006
Firstpage
1
Lastpage
6
Abstract
This paper focus on the study of solder constitutive model effect on solder joint fatigue life prediction. Two loading conditions are considered, namely thermal cycling and cyclic bending. In this study, four different solder constitutive models including elastic-plastic (EP), elastic-creep (Creep), elastic-plastic-creep (EPC) and viscoplastic Anand´s (Anand) models are implemented in FE modeling and simulation for comparison. Two cases involving in plastic-ball-grid-array (PBGA) assembly subjected to thermal cycling and very-thin-quad-flat-no-lead (VQFN) assembly subjected to cyclic bending are selected for investigating solder constitutive model effect on solder fatigue life and stress-strain behavior. Fatigue life prediction shows that the creep, EPC and Anand models result in consistent fatigue life for PBGA assembly. When using EPC model, the creep deformation is dominant for PBGA assembly. For cyclic bending study for VQFN assembly, the significant different simulation result can be found when using different constitutive models. Results show that EP and EPC model can lead to similar result and accumulated strain energy density per cycle is easier to converge, while creep model is equivalent to Anand´s model which result in lower strain energy density value for high temperature bending. The thermal cycling fatigue test data for PBGA is also presented for validating FE simulation results
Keywords
ball grid arrays; bending; creep; fatigue; finite element analysis; plastic packaging; solders; stress-strain relations; viscoplasticity; Anand model; constitutive model effect; cyclic bending; elastic-plastic-creep model; fatigue life prediction; finite element simulation; plastic ball grid array; solder joints; stress-strain behavior; thermal cycling; very thin quad flat no-lead assembly; viscoplastic model; Assembly; Capacitive sensors; Creep; Environmentally friendly manufacturing techniques; Fatigue; Iron; Lead; Predictive models; Soldering; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0619-6
Electronic_ISBN
1-4244-0620-X
Type
conf
DOI
10.1109/ICEPT.2006.359842
Filename
4198963
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