• DocumentCode
    2577108
  • Title

    Modeling Constitutive Model Effect on Reliability of Lead-Free Solder Joints

  • Author

    Che, F.X. ; Pang, H.L.J. ; Zhu, W.H. ; Sun, Wei ; Sun, Anthony Y S

  • Author_Institution
    Packaging Anal. & Design Center, United Test & Assembly Center Ltd., Singapore
  • fYear
    2006
  • fDate
    26-29 Aug. 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper focus on the study of solder constitutive model effect on solder joint fatigue life prediction. Two loading conditions are considered, namely thermal cycling and cyclic bending. In this study, four different solder constitutive models including elastic-plastic (EP), elastic-creep (Creep), elastic-plastic-creep (EPC) and viscoplastic Anand´s (Anand) models are implemented in FE modeling and simulation for comparison. Two cases involving in plastic-ball-grid-array (PBGA) assembly subjected to thermal cycling and very-thin-quad-flat-no-lead (VQFN) assembly subjected to cyclic bending are selected for investigating solder constitutive model effect on solder fatigue life and stress-strain behavior. Fatigue life prediction shows that the creep, EPC and Anand models result in consistent fatigue life for PBGA assembly. When using EPC model, the creep deformation is dominant for PBGA assembly. For cyclic bending study for VQFN assembly, the significant different simulation result can be found when using different constitutive models. Results show that EP and EPC model can lead to similar result and accumulated strain energy density per cycle is easier to converge, while creep model is equivalent to Anand´s model which result in lower strain energy density value for high temperature bending. The thermal cycling fatigue test data for PBGA is also presented for validating FE simulation results
  • Keywords
    ball grid arrays; bending; creep; fatigue; finite element analysis; plastic packaging; solders; stress-strain relations; viscoplasticity; Anand model; constitutive model effect; cyclic bending; elastic-plastic-creep model; fatigue life prediction; finite element simulation; plastic ball grid array; solder joints; stress-strain behavior; thermal cycling; very thin quad flat no-lead assembly; viscoplastic model; Assembly; Capacitive sensors; Creep; Environmentally friendly manufacturing techniques; Fatigue; Iron; Lead; Predictive models; Soldering; Thermal loading;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2006. ICEPT '06. 7th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0619-6
  • Electronic_ISBN
    1-4244-0620-X
  • Type

    conf

  • DOI
    10.1109/ICEPT.2006.359842
  • Filename
    4198963