• DocumentCode
    2579327
  • Title

    Application of solderable devices for assembling three-dimensional power electronics modules

  • Author

    Lu, Guo-Quan ; Liu, Xingslieng

  • Author_Institution
    Power Electron. Packaging Lab., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1261
  • Abstract
    Power semiconductor bond wires are known to cause high interconnection resistance, switching noise, parasitic oscillations, nonuniform current distribution, and fatigue failure. The wire-bonded device and modules are also limited to unidirectional heat dissipation that limits packaging density. Consequently, they are difficult to integrate into three-dimensional multichip packages that are expected to offer improved system performance. Our research and development efforts aim to investigate three-dimensional packaging of integrated power electronics modules (IPEMs) where interconnections are provided via bond-wireless techniques. This paper presents the application of solderable power devices for building 30 kW, 3-D bond-wireless IPEMs. Experimental results show that the solder interconnection of power devices in the modules significantly lowers resistance, parasitics, and noise
  • Keywords
    assembling; modules; power semiconductor devices; semiconductor device manufacture; semiconductor device packaging; soldering; 30 kW; bond-wireless techniques; fatigue failure; high interconnection resistance; integrated power electronics modules; noise reduction; nonuniform current distribution; packaging density; parasitic oscillations; parasitics reduction; power semiconductor bond wires; resistance reduction; solder interconnection; solderable devices; solderable power devices; switching noise; three-dimensional multichip packages; three-dimensional packaging; three-dimensional power electronics modules; unidirectional heat dissipation; wire-bonded device; wire-bonded modules; Assembly; Bonding; Current distribution; Electronics packaging; Fatigue; Power semiconductor switches; Power system interconnection; Semiconductor device noise; Semiconductor device packaging; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
  • Conference_Location
    Galway
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-5692-6
  • Type

    conf

  • DOI
    10.1109/PESC.2000.880491
  • Filename
    880491