• DocumentCode
    2579373
  • Title

    Thermal fatigue resistance evaluation of solder joints in IGBT power modules for traction applications

  • Author

    Thébaud, J.M. ; Woirgard, E. ; Zardini, C. ; Sommer, K.-H.

  • Author_Institution
    Bordeaux I Univ., Talence, France
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1285
  • Abstract
    Several ageing test campaigns have been carried out to evaluate thermal fatigue resistance of solder alloys used in IGBT power modules. The solder joint between the ceramic substrate and the copper baseplate of this stack packaging has been the focus of these experiments. Indeed, this interconnection layer is highly subject to shear strains and stresses due to the mismatched expansion on either side of the solder joint during operation. The impact of the substrate metallization and of the cooling rate has been evaluated by measuring crack growth rate on cross sections of cycled solder joints. Two solder alloy compositions have been selected: a lead-free one and a lead-bearing one. Scanning electronic microscopy analyses have allowed a study of cracking at the microstructural level. Moreover, additional analyses based on scanning acoustic microscopy have led to a ranking of the batches under test. Best results in terms of thermal fatigue resistance have been obtained with the lead-bearing solder alloy. Furthermore, it has been shown that the use of bare copper substrates, and above, all fast cooling rate after the solder reflow, delay solder joint failure
  • Keywords
    acoustic microscopy; ageing; crack detection; insulated gate bipolar transistors; modules; power convertors; reflow soldering; scanning electron microscopy; thermal stress cracking; traction; IGBT power modules; ageing test; bare copper substrates; ceramic substrate; cooling rate; copper baseplate; crack growth rate measurement; cycled solder joints; fast cooling rate; interconnection layer; lead-bearing solder alloy composition; lead-free solder alloy composition; microstructural level cracking analysis; scanning acoustic microscopy; scanning electronic microscopy; shear strains; shear stresses; solder alloys; solder joint failure; solder joints; solder reflow; stack packaging; substrate metallization; thermal fatigue resistance evaluation; traction; Aging; Copper; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fatigue; Insulated gate bipolar transistors; Lead; Soldering; Testing; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2000. PESC 00. 2000 IEEE 31st Annual
  • Conference_Location
    Galway
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-5692-6
  • Type

    conf

  • DOI
    10.1109/PESC.2000.880495
  • Filename
    880495