• DocumentCode
    2581306
  • Title

    Combined detection and source analysis of epileptic EEG spikes

  • Author

    Van Hoey, G. ; Vanrumste, B. ; Boon, P. ; D´Havé, M. ; Van de Walle, R. ; Lemahieu, I.

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
  • Volume
    4
  • fYear
    1998
  • fDate
    29 Oct-1 Nov 1998
  • Firstpage
    2159
  • Abstract
    We present a method for the detection of focal epileptic spikes in the EEG (electroencephalogram). The method is based on the dipole source localisation technique and provides a source location estimate for each detected spike. In the first section of the paper, a theoretical introduction is given about dipole source localisation, followed by a description of the modifications that were made to it for a more efficient calculation. An additional decision variable is introduced to exploit the high amplitude of the spikes that are searched for, without however imposing constraints on the precise shape of the waveforms. In the next section the efficiency of the method is discussed on the basis of an experiment with an EEG measurement from an epilepsy patient. It is shown that the method is capable of detecting and localising most of the epileptic spikes present in the EEG, while producing only few false-positive detections
  • Keywords
    diseases; electroencephalography; medical signal processing; patient diagnosis; EEG measurement; additional decision variable; combined detection/source analysis; dipole source localisation technique; epilepsy patient; epileptic electroencephalogram spikes; false-positive detections; focal epileptic spikes; precise shape; source location estimate; theoretical introduction; waveforms; Brain modeling; Electric variables measurement; Electrodes; Electroencephalography; Epilepsy; Equations; Information systems; Monitoring; Nervous system; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
  • Conference_Location
    Hong Kong
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-5164-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.1998.747037
  • Filename
    747037