• DocumentCode
    2581317
  • Title

    Development of a three-dimensional electron microscope for stereoscopic observation of nano-structures

  • Author

    Kakibayashi, H.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    2003
  • fDate
    29-31 Oct. 2003
  • Firstpage
    304
  • Lastpage
    305
  • Abstract
    Stereoscopic observation of nanostructures is one of the ultimate goals in the analytical technology field. Three-dimensional (3D) structures and elemental bonding states in the nanometer area affect the function and performance of new materials and advanced devices. Thus, their evaluation at high resolution and high accuracy becomes very important. We have developed a high performance 3D electron microscope solving those issues. The goals were a 3D resolution of 0.5 nm and an energy resolution of 0.5 eV in electron energy loss spectroscopy. Various technologies to achieve those goals were developed and integrated as a 3D electron microscope system.
  • Keywords
    electron energy loss spectra; electron microscopes; nanostructured materials; 0.5 nm; 3D resolution; electron energy loss spectroscopy; nanostructures; stereoscopic observation; three-dimensional electron microscopy; Bonding; Chemical technology; Computed tomography; Electron microscopy; Energy loss; Energy resolution; Image reconstruction; Laboratories; Nanoscale devices; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-040-2
  • Type

    conf

  • DOI
    10.1109/IMNC.2003.1268767
  • Filename
    1268767