DocumentCode
2581317
Title
Development of a three-dimensional electron microscope for stereoscopic observation of nano-structures
Author
Kakibayashi, H.
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear
2003
fDate
29-31 Oct. 2003
Firstpage
304
Lastpage
305
Abstract
Stereoscopic observation of nanostructures is one of the ultimate goals in the analytical technology field. Three-dimensional (3D) structures and elemental bonding states in the nanometer area affect the function and performance of new materials and advanced devices. Thus, their evaluation at high resolution and high accuracy becomes very important. We have developed a high performance 3D electron microscope solving those issues. The goals were a 3D resolution of 0.5 nm and an energy resolution of 0.5 eV in electron energy loss spectroscopy. Various technologies to achieve those goals were developed and integrated as a 3D electron microscope system.
Keywords
electron energy loss spectra; electron microscopes; nanostructured materials; 0.5 nm; 3D resolution; electron energy loss spectroscopy; nanostructures; stereoscopic observation; three-dimensional electron microscopy; Bonding; Chemical technology; Computed tomography; Electron microscopy; Energy loss; Energy resolution; Image reconstruction; Laboratories; Nanoscale devices; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2003. Digest of Papers. 2003 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-040-2
Type
conf
DOI
10.1109/IMNC.2003.1268767
Filename
1268767
Link To Document