• DocumentCode
    2583508
  • Title

    Integration of Knowledge Discovery techniques in the Quality Management model to achieve higher target quality

  • Author

    Ansari Ch, F. ; Sassenberg, Christian ; Fathi, Madjid ; Montino, Ralf

  • Author_Institution
    Univ. of Siegen, Siegen, Germany
  • fYear
    2009
  • fDate
    22-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Improving the quality of products is an important issue in the modern business world. Traditional approaches of Quality Management (QM) are not adequate to fulfil the demands on target quality of products. This study reveals that synergetic approaches based on the integration of Knowledge Management (KM) in Total Quality Management (TQM) have a direct impact on enhancing the quality of products. We also propose a management model to synthesize elements of both methodologies under an integrative framework. Furthermore, Knowledge Discovery in Databases (KDD) is introduced to realize the effectiveness of the proposed management model and to illustrate the influence of this synergetic approach taking the semiconductor industry as exemplary field of application.
  • Keywords
    data mining; database management systems; quality management; databases; knowledge discovery techniques; knowledge management; quality management model; semiconductor industry; target quality; Costs; Customer satisfaction; Databases; Electronics industry; Knowledge management; Manufacturing; Production; Quality management; Supply chains; Total quality management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies & Factory Automation, 2009. ETFA 2009. IEEE Conference on
  • Conference_Location
    Mallorca
  • ISSN
    1946-0759
  • Print_ISBN
    978-1-4244-2727-7
  • Electronic_ISBN
    1946-0759
  • Type

    conf

  • DOI
    10.1109/ETFA.2009.5347032
  • Filename
    5347032