• DocumentCode
    2584787
  • Title

    60GHz-band low loss on-chip band pass filter with patterned ground shields for millimeter wave CMOS SoC

  • Author

    Pokharel, Ramesh K. ; Liu, Xin ; Dong, R. ; Dayang, A.B.A. ; Kanaya, Haruichi ; Yoshida, Keiji

  • Author_Institution
    EJUST Center, Kyushu Univ., Fukuoka, Japan
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a design of an improved on-chip open loop resonator band pass filter (OLR-BPF) for 60 GHz millimeter-wave applications in 0.18 μm CMOS technology. The proposed on-chip BPF employs the folded open loop structure on patterned ground shields. The adoption of a folded structure for the OLR-BPF and utilization of two transmissions zero permits a compact size and high selectivity for the BPF. In addition, the patterned ground shields obviously slowed down the guided waves, which enables a further reduction of the physical length of the resonator and finally an improvement of the insertion loss of the BPF. By comparison between the electromagnetic (EM) simulations and measurement results, the proposed BPF has the center frequency of 59 GHz, insertion loss 2.77 dB, band width 14 GHz, return loss is less than 27.5 dB, and chip size 910×650 μm2 (including bonding pads).
  • Keywords
    CMOS integrated circuits; band-pass filters; resonator filters; resonators; system-on-chip; CMOS technology; electromagnetic simulation; folded structure; frequency 14 GHz; frequency 59 GHz; frequency 60 GHz; insertion loss; loss 2.77 dB; millimeter wave CMOS SoC; millimeter-wave application; on-chip open loop resonator band pass filter; open loop structure; selectivity; size 0.18 mum; Band pass filters; CMOS integrated circuits; CMOS technology; Couplings; Insertion loss; Microstrip; System-on-a-chip; CMOS; insertion loss; on-chip bandpass filter; selectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5972789
  • Filename
    5972789