• DocumentCode
    2585019
  • Title

    Gate Engineering For Performance And Reliability In Deep-submicron CMOS Technology

  • Author

    Bin Yu ; Dong-Hyuk Ju ; Kepler, N. ; Tsu-Jae King ; Chenming Hu

  • Author_Institution
    Dept. of EECS, University of Cafifomia, Berkeley, CA 94720, USA
  • fYear
    1997
  • fDate
    10-12 June 1997
  • Firstpage
    105
  • Lastpage
    106
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1997. Digest of Technical Papers., 1997 Symposium on
  • Print_ISBN
    4-930813-75-1
  • Type

    conf

  • DOI
    10.1109/VLSIT.1997.623717
  • Filename
    623717
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2585019