• DocumentCode
    2585270
  • Title

    Modeling of the mechanical behavior during programming of a non-volatile phase-change memory cell using a coupled electrical-thermal-mechanical finite-element simulator

  • Author

    Gille, Thomas ; Lisoni, Judit ; Goux, Ludovic ; De Meyer, Kristin ; Wouters, Dirk J.

  • Author_Institution
    IMEC, Leuven
  • fYear
    2007
  • fDate
    16-18 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    During programming of a phase-change memory cell, the material is locally heated up to high temperatures (>600degC), to induce phase transitions as crystallization (SET) or amorphization by quenched cooling (RESET). In this work, the thermo-mechanical stresses induced in a line-type phase-change memory cell were examined using electrical-thermal-mechanical coupled finite-element simulation. Specific procedures are described, for implementing particular mechanical characteristics of the phase-change material, i.e. the volume change on crystallization, the relaxation and the phase-dependent Young moduli. Their respective effects during SET and RESET programming are investigated.
  • Keywords
    Young´s modulus; amorphisation; crystallisation; finite element analysis; high-temperature effects; phase change materials; random-access storage; thermomechanical treatment; PCRAM; RESET programming; SET programming; Young´s moduli; amorphization; crystallization; electrical-thermal-mechanical finite-element simulator; high temperature effects; nonvolatile phase-change memory cell; phase transitions; phase-change material; phase-change random-access memory; thermo-mechanical stresses; Cooling; Couplings; Crystalline materials; Crystallization; Finite element methods; Nonvolatile memory; Phase change memory; Temperature; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
  • Conference_Location
    London
  • Print_ISBN
    1-4244-1105-X
  • Electronic_ISBN
    1-4244-1106-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2007.359945
  • Filename
    4201142