DocumentCode
2586596
Title
Coplanar waveguide with defected ground structure for nanosecond subcellular electroporation
Author
Palego, C. ; Halder, S. ; Hwang, J. C M ; Merla, C. ; Liberti, M. ; Apollonio, F. ; Paffi, A.
Author_Institution
Lehigh Univ., Bethlehem, PA, USA
fYear
2011
fDate
5-10 June 2011
Firstpage
1
Lastpage
4
Abstract
Compact measurement setup and test structure for nanosecond electroporation of biological cells were demonstrated. The test structure was based on a coplanar waveguide with a defected ground structure that afforded broadband impedance match with little dispersion or parasitic. The defected ground structure with a 10-μm gap formed a microchamber to readily accept biological solutions and to allow the measurement to be quickly performed before the solution evaporated or the cell activity changed. The measured results in conjunction with detailed electromagnetic analysis of a three-layer spherical cell model showed that the present measurement setup was capable of delivering a nanosecond 0.1-V potential across a plasmatic membrane. This transmembrane potential, although an order of magnitude lower than the typical threshold for membrane poration, could be increased by using nanosecond pulses with order-of-magnitude higher amplitude or 10-ns pulses with three times higher amplitude.
Keywords
bioelectric phenomena; coplanar waveguides; defected ground structures; impedance matching; microelectrodes; pulse measurement; biological cells; broadband impedance matching; compact measurement setup; coplanar waveguide; defected ground structure; electromagnetic analysis; microchamber; nanosecond subcellular electroporation; plasmatic membrane; size 10 mum; test structure; three-layer spherical cell model; time 10 ns; transmembrane potential; voltage 0.1 V; Biomembranes; Electric fields; Electric potential; Generators; Impedance; Nanobioscience; Pulse measurements; Bioelectric phenomena; biological cells; microelectrodes; pulse measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location
Baltimore, MD
ISSN
0149-645X
Print_ISBN
978-1-61284-754-2
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2011.5972888
Filename
5972888
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