• DocumentCode
    2586632
  • Title

    Hierarchical variance analysis for analog circuits based on graph modelling and correlation loop tracing

  • Author

    Liu, Fang ; Flomenberg, Jacob J. ; Yasaratne, Devaka V. ; Ozev, Sule

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    126
  • Abstract
    Process variations play an increasingly important role on the success of analog circuits. State-of-the-art analog circuits are based on complex architectures and contain many hierarchical layers and parameters. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. We present a hierarchical variance analysis methodology for analog circuits. In the proposed method, we make use of previously computed values whenever possible so as to reduce computational time. Experimental results indicate that the proposed method provides both accuracy and computational efficiency when compared with prior approaches.
  • Keywords
    VLSI; analogue integrated circuits; circuit analysis computing; correlation methods; electronic design automation; fault tolerance; graph theory; integrated circuit design; integrated circuit testing; statistical analysis; VLSI design; accuracy; analog circuits; complex architectures; computational efficiency; correlation loop tracing; design automation; fault tolerance; graph modelling; hierarchical variance analysis; parameter variances; process variations; testing; Analog circuits; Analysis of variance; Automatic testing; Circuit analysis; Circuit simulation; Circuit testing; Delay; Design automation; Fault tolerance; Tolerance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.175
  • Filename
    1395542