DocumentCode
2586632
Title
Hierarchical variance analysis for analog circuits based on graph modelling and correlation loop tracing
Author
Liu, Fang ; Flomenberg, Jacob J. ; Yasaratne, Devaka V. ; Ozev, Sule
Author_Institution
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear
2005
fDate
7-11 March 2005
Firstpage
126
Abstract
Process variations play an increasingly important role on the success of analog circuits. State-of-the-art analog circuits are based on complex architectures and contain many hierarchical layers and parameters. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. We present a hierarchical variance analysis methodology for analog circuits. In the proposed method, we make use of previously computed values whenever possible so as to reduce computational time. Experimental results indicate that the proposed method provides both accuracy and computational efficiency when compared with prior approaches.
Keywords
VLSI; analogue integrated circuits; circuit analysis computing; correlation methods; electronic design automation; fault tolerance; graph theory; integrated circuit design; integrated circuit testing; statistical analysis; VLSI design; accuracy; analog circuits; complex architectures; computational efficiency; correlation loop tracing; design automation; fault tolerance; graph modelling; hierarchical variance analysis; parameter variances; process variations; testing; Analog circuits; Analysis of variance; Automatic testing; Circuit analysis; Circuit simulation; Circuit testing; Delay; Design automation; Fault tolerance; Tolerance analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.175
Filename
1395542
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