DocumentCode
2587479
Title
Packaging Aspects of Photodetector Modules for 100 Gbit/s Ethernet Applications
Author
Jiang, C. ; Mekonnen, G.G. ; Krozer, V. ; Johansen, T.K. ; Bach, H.-G.
Author_Institution
Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby
fYear
2008
fDate
27-28 Oct. 2008
Firstpage
550
Lastpage
553
Abstract
Packaging is a major problem at millimetre-wave frequencies approaching 100 GHz. In this paper we present that insertion losses in a multi-chip module (MCM) can be less IL <0.6 dB at 100 GHz. The paper also analyzes in detail resonance modes in the packages. The characteristic of conductor-backed coplanar waveguides (CBCPWs) with vias is accurately analyzed using 3D electromagnetic (EM) simulation over a wide frequency range. Patch antenna mode resonances are identified as a major origin of resonances in simulated and measured transmission characteristics of the CBCPW with vias. Based on EM simulations, we propose several optimized arrangements for vias and bonding wires placement, to efficiently suppress the resonances and achieve excellent transmission performance of the PD module packaging. Based on our simulated results we postulate that it is possible to obtain resonance-free electrical transmission in the PD package with IL <0.6 dB over a frequency from DC to 110 GHz.
Keywords
coplanar waveguides; integrated circuit packaging; local area networks; microstrip antennas; multichip modules; photodetectors; 3D electromagnetic simulation; Ethernet applications; bit rate 100 Gbit/s; conductor-backed coplanar waveguides; frequency 100 GHz; frequency 110 GHz; multichip module insertion losses; patch antenna mode resonances; photodetector module packaging; resonance modes; resonance-free electrical transmission; Coplanar waveguides; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic waveguides; Ethernet networks; Frequency; Insertion loss; Packaging; Photodetectors; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location
Amsterdam
Print_ISBN
978-2-87487-007-1
Type
conf
DOI
10.1109/EMICC.2008.4772351
Filename
4772351
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