DocumentCode
2588612
Title
Qualification and integration of complex I/O in SoC design flows
Author
Abraham, Jay ; Rao, Guruprasad
Author_Institution
Silicon Correlation Div., Magma Design Autom., Santa Clara, CA, USA
Volume
3
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
286
Abstract
Low power, high speed, and reduced cost requirements force integration of specialized Intellectual Property (IP) like complex I/O blocks on a system on chip (SoC). Today designers have access to a variety of specialized IP blocks and cells for use in SoC design flows. Complex I/O appear in a myriad of standards such as USB 1.0/1.1/2.0, IEEE 1394 a/b (firewire), SSTL, HSTL, PCl-X, LVDS, and more. These new standards are driven by consumer´s demand for bandwidth and capability, and the industry´s desire to reuse proven design blocks in vastly different applications and domains. Integration of these specialized IP blocks introduces increased complexity to design flows. For example, digital designs must now consider the analog like properties of some complex I/O. This paper discusses the uniqueness of embedding complex I/O in a SoC. The features and properties that differentiate complex I/O from standard design practices will be described. Finally methodologies for characterizing and building accurate digital abstractions of I/O will be presented.
Keywords
nanotechnology; system-on-chip; SoC design flows; complex I/O design; complex input/output design; digital design; intellectual property integration; nanotechnology; system on chip design flows; Costs; Design automation; Energy consumption; Failure analysis; Firewire; Leakage current; Performance analysis; Qualifications; Silicon; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1269252
Filename
1269252
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