• DocumentCode
    2589525
  • Title

    Shapelets correlated with surface normals produce surfaces

  • Author

    Kovesi, Peter

  • Author_Institution
    Sch. of Comput. Sci. & Software Eng., Western Australia Univ., Crawley, WA
  • Volume
    2
  • fYear
    2005
  • fDate
    17-21 Oct. 2005
  • Firstpage
    994
  • Abstract
    This paper addresses the problem of deducing the surface shape of an object given just the surface normals. Many shape measurement algorithms such as shape from shading and shape from texture only return the surface normals of an object, often with an ambiguity of pi in the surface tilt. The surface shape has to be inferred from these normals, typically via some integration process. However; reconstruction through the integration of surface gradients is sensitive to noise and the choice of integration paths across the surface. In addition, existing techniques cannot accommodate ambiguities in tilt. This paper presents a new approach to the reconstruction of surfaces from surface normals using basis functions, referred to here as shapelets. The surface gradients of the shapelets are correlated with the gradients of the surface and the correlations summed to form the reconstruction. This results in a simple reconstruction process that is very robust to noise. Where there is an ambiguity of it in the surface tilt, reconstructions of reduced quality are still possible up to a positive/negative shape ambiguity. Intriguingly, some form of reconstruction is also possible using just slant information
  • Keywords
    computational geometry; surface reconstruction; basis functions; shape measurement algorithms; shapelets; surface gradients; surface normals; surface reconstruction; surface shape; surface tilt; Australia; Computer science; Computer vision; Noise robustness; Noise shaping; Shape measurement; Software engineering; Stability; Surface reconstruction; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2005. ICCV 2005. Tenth IEEE International Conference on
  • Conference_Location
    Beijing
  • ISSN
    1550-5499
  • Print_ISBN
    0-7695-2334-X
  • Type

    conf

  • DOI
    10.1109/ICCV.2005.224
  • Filename
    1544829