DocumentCode
2589979
Title
New schemes for self-testing RAM
Author
Bodean, Gh ; Bodean, D. ; Labunetz, A.
Author_Institution
Tech. Univ. of Moldova, Kishinau, Moldova
fYear
2005
fDate
7-11 March 2005
Firstpage
858
Abstract
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing a wide type of random access memories (RAM): bit-or word-oriented and single- or dual-port RAM. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
Keywords
Galois fields; logic testing; random-access storage; Galois field; PRT; RAM self-testing; bit-oriented RAM; dual-port RAM; linear automaton emulation; memory components; pseudo-ring testing; random access memories; single-port RAM; word-oriented RAM; Algorithm design and analysis; Automata; Automatic testing; Bills of materials; Built-in self-test; Galois fields; Logic; Polynomials; Random access memory; Read-write memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.223
Filename
1395689
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