DocumentCode
2590091
Title
Electrical Detection of Surface Effects in Transistors
Author
Card, W.Howard
Author_Institution
Syracuse University
fYear
1962
fDate
Sept. 1962
Firstpage
231
Lastpage
245
Keywords
Degradation; Electric variables measurement; Electrical resistance measurement; Failure analysis; Germanium alloys; Noise measurement; Pollution measurement; Semiconductor device noise; Surface contamination; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1962.359999
Filename
4202005
Link To Document