DocumentCode
2591078
Title
Learning models for predicting recognition performance
Author
Wang, Rong ; Bhanu, Bir
Author_Institution
Inst. Center for Res. in Intelligent Syst., California Univ., Riverside, CA
Volume
2
fYear
2005
fDate
17-21 Oct. 2005
Firstpage
1613
Abstract
This paper addresses one of the fundamental problems encountered in performance prediction for object recognition. In particular we address the problems related to estimation of small gallery size that can give good error estimates and their confidences on large probe sets and populations. We use a generalized two-dimensional prediction model that integrates a hypergeometric probability distribution model with a binomial model explicitly and considers the distortion problem in large populations. We incorporate learning in the prediction process in order to find the optimal small gallery size and to improve its performance. The Chernoff and Chebychev inequalities are used as a guide to obtain the small gallery size. During the prediction we use the expectation-maximum (EM) algorithm to learn the match score and the non-match score distributions (the number of components, their weights, means and covariances) that are represented as Gaussian mixtures. By learning we find the optimal size of small gallery and at the same time provide the upper bound and the lower bound for the prediction on large populations. Results are shown using real-world databases
Keywords
Gaussian processes; expectation-maximisation algorithm; learning (artificial intelligence); object recognition; statistical distributions; 2D prediction model; Chebychev inequalities; Chernoff inequalities; Gaussian mixtures; error estimates; expectation-maximum algorithm; hypergeometric probability distribution; learning models; object recognition; Biometrics; Image databases; Image recognition; Intelligent systems; Object recognition; Predictive models; Probability distribution; Probes; Uncertainty; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision, 2005. ICCV 2005. Tenth IEEE International Conference on
Conference_Location
Beijing
ISSN
1550-5499
Print_ISBN
0-7695-2334-X
Type
conf
DOI
10.1109/ICCV.2005.139
Filename
1544910
Link To Document